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tap|TALK


May 11, 2018

Geoff Meyer, Test Architect and QA Thought Leader from Dell EMC joins tap|TALK to discuss Artificial Intelligence and Machine Learning, and how it is impacting QA and Test Automation, as well as Software Development as a whole.  Geoff spoke on these topics as the Keynote Address at STAREAST 2018, and shares some great info on this edition of tap|TALK. 

This is a great episode for QA Practitioners and Technology Leaders alike!