May 11, 2018
Geoff Meyer, Test Architect and QA Thought Leader from Dell EMC
joins tap|TALK to discuss Artificial Intelligence and Machine
Learning, and how it is impacting QA and Test Automation, as well
as Software Development as a whole. Geoff spoke on these
topics as the Keynote Address at STAREAST 2018, and shares some
great info on this edition of tap|TALK.
This is a great episode for QA Practitioners and Technology Leaders alike!